- Process node
- The name of a manufacturing generation — 7nm, 5nm, 3nm, 2nm. Since roughly the 28nm generation the number has been a marketing label, not a measurement of any physical feature on the chip. Compare density, power and performance, never the name.
- FinFET
- Transistor with a raised fin of silicon wrapped by the gate on three sides. Replaced the planar transistor from around the 22nm generation and carried the industry through the 5nm and 3nm era.
- Gate-all-around (nanosheet)
- Transistor in which the gate surrounds stacked horizontal sheets of channel on all four sides, giving better electrostatic control than a FinFET. The structure the 2nm-class generations are built on.
- EUV and High-NA EUV
- Extreme ultraviolet lithography at 13.5nm wavelength, supplied by a single vendor, that made sub-7nm patterning practical. High-NA is the next-generation, larger-aperture version — better resolution, a smaller printable field, and a substantially higher tool price.
- Photolithography
- Projecting a circuit pattern from a mask onto photoresist on the wafer so it can be developed and transferred into the underlying film. Repeated dozens of times per wafer; the single most expensive step and the one that gates resolution.
- Mask, reticle and the reticle limit
- The mask (reticle) carries the pattern for one exposure field. The reticle limit is the largest die a single exposure can print — roughly 800 square millimetres on current scanners — which is why very large chips must be split into stitched or separately packaged pieces.
- Etch and deposition
- The paired subtractive and additive steps. Etch removes material selectively through the resist pattern; deposition (CVD, PVD, ALD, epitaxy) lays down the conductor, dielectric and barrier films. A modern flow runs hundreds of these steps.
- CMP
- Chemical mechanical planarisation — polishing the wafer flat between layers using a slurry and pad. Without it the stack of interconnect layers would not stay in focus for the next lithography step.
- Ion implantation
- Firing dopant ions into the silicon to set its electrical character, followed by anneal to repair damage and activate the dopant. Dose and energy control the device threshold.
- Wafer size — 200mm vs 300mm
- 300mm wafers carry roughly 2.25 times the area of 200mm and dominate advanced logic and memory. Much of analog, power and automotive still runs on 200mm, where used-tool scarcity has been a real constraint on adding capacity.
- Die
- One individual chip on the wafer before it is separated. Die size drives everything downstream — how many fit per wafer, how yield behaves, and what the part can cost.
- Yield
- The share of die on a wafer that pass test. Because a fab's costs are nearly all fixed, yield is the main lever on cost per good die, and yield learning over the life of a process is where most of the margin comes from.
- Defect density and D0
- Killer defects per unit area. D0 feeds yield models — Poisson, Murphy, negative binomial — that predict yield from die area and defect density. Bigger die punish the same D0 far harder, which is a core argument for chiplets.
- Wafer starts and WSPM capacity
- Wafer starts per month is the standard unit of fab capacity. Announced WSPM figures are for a full build-out and rarely describe what a plant can run on the day it opens.
- Cycle time and fab utilisation
- Cycle time is calendar time from wafer start to finished wafer, typically measured in months for advanced logic. Utilisation is how full the fab is; because fixed cost dominates, a plant running below roughly 80 percent loses money on wafers that are otherwise perfectly good.
- Foundry, IDM and fabless
- A foundry manufactures to other companies' designs. An IDM designs and manufactures its own products. A fabless company designs and outsources fabrication. The choice determines capex intensity, cycle exposure and how much of the supply chain a company actually controls.
- OSAT
- Outsourced semiconductor assembly and test — the contract packagers and test houses that take finished wafers and turn them into packaged, tested parts. Concentrated in Asia, and now a bottleneck for advanced packaging as much as wafer capacity is.
- Tape-out
- The moment a finished design database is released to mask-making. The name survives from the era of magnetic tape. It is a hard commit: after tape-out, fixing anything means new masks and months of calendar.
- PDK
- Process design kit — the models, rules, symbols and libraries a foundry supplies so a design team can build for its process. The PDK, not the marketing node name, defines what the design can actually do.
- IP core and licensing
- Pre-designed, pre-verified blocks — CPU and GPU cores, memory controllers, SerDes, interface PHYs — licensed rather than built in-house, usually with an upfront fee plus per-unit royalty. Most of a modern SoC is licensed IP.
- EDA flow
- The chain of electronic design automation tools that carries a chip from specification to manufacturable layout, plus the verification and sign-off steps at each stage. Three vendors supply nearly all of it.
- RTL
- Register-transfer level — the hardware description in Verilog, SystemVerilog or VHDL that specifies behaviour cycle by cycle. The level at which designers actually work.
- Synthesis and place-and-route
- Synthesis compiles RTL into a gate-level netlist against a standard-cell library. Place-and-route positions those cells and wires them together under timing, power, congestion and manufacturability constraints. Together they turn logic into geometry.
- DFT
- Design for test — scan chains, built-in self-test and compression structures added so a manufactured die can be exercised on a tester. Skimping on DFT means defective parts escape to customers.
- Static timing analysis
- Exhaustive check that every path meets setup and hold requirements across process, voltage and temperature corners, without simulating vectors. Timing closure is usually the longest pole in a physical design schedule.
- DRC and LVS
- Design rule check confirms the layout obeys the foundry's geometric rules; layout versus schematic confirms the layout is electrically the circuit that was intended. Both must be clean before a foundry will accept a tape-out.
- Silicon bring-up and respin
- Bring-up is the lab campaign on first silicon — power, clocks, boot, interfaces, characterisation. A respin is a new mask revision to fix what bring-up found. Respins cost a mask set and a quarter or more of schedule, which is why verification budgets are what they are.
- Mask set cost and NRE
- Non-recurring engineering is the one-time cost of getting to production — tools, IP, engineering effort and the mask set. Mask sets run from tens of thousands of dollars at mature nodes to the high single-digit millions at the leading edge, and that number alone decides which products can justify an advanced node.
- ASP
- Average selling price. In semiconductors ASP erosion is the normal condition — prices fall over a product's life while cost falls with yield learning — so plans are built around the gap between the two curves, not around a fixed price.
- Gross margin structure
- Foundries carry heavy depreciation and live or die on utilisation. Fabless companies carry little fixed cost but pay wafer prices set by someone else. IDMs sit between. The same revenue produces very different economics depending on the model.
- Advanced packaging
- Everything past the wafer that adds value through integration rather than lithography — fan-out, interposers, stacking, hybrid bonding, embedded bridges. The main axis of performance improvement now that lithographic scaling has slowed and got expensive.
- 2.5D and 3D integration
- In 2.5D, multiple die sit side by side on a silicon interposer or bridge that carries the short, dense connections between them. In 3D, die are stacked vertically with through-silicon vias or direct hybrid bonds. 3D gives shorter connections and harder thermal problems.
- CoWoS
- Chip-on-Wafer-on-Substrate, TSMC's 2.5D packaging family that mounts logic die and HBM stacks on a silicon interposer. Capacity for this class of packaging, not wafer capacity, has been the practical ceiling on AI accelerator shipments.
- Chiplet
- A functional die designed to be combined with others in one package rather than shipped alone. Chiplets let a design mix process nodes, dodge the reticle limit and improve yield by keeping individual die small.
- UCIe
- Universal Chiplet Interconnect Express — an open die-to-die interconnect standard covering the physical layer, protocol and package options, intended to make chiplets from different vendors interoperable. The precondition for a genuine merchant chiplet market.
- HBM
- High bandwidth memory — DRAM die stacked vertically with through-silicon vias and placed next to the processor, trading capacity per dollar for enormous bandwidth. AI accelerator performance is usually memory-bandwidth bound, which is why HBM supply is contracted years ahead.
- Substrate
- The organic build-up laminate the die and interposer mount on, carrying signals out to the board. ABF substrates for large packages have been a repeated shortage point, and the supply base sits almost entirely in Asia.
- Test, burn-in and binning
- Wafer sort screens die before packaging; final test screens packaged parts. Burn-in runs parts hot and biased to force early-life failures out before shipment — standard for automotive and high-reliability grades and a real contributor to unit cost. A bin is the speed, power or feature grade a tested part is sorted into, which turns unavoidable process variation into a product ladder: the same die can ship as a premium or a value part depending on where it lands.
- JEDEC and AEC-Q100
- JEDEC sets memory and packaging standards, including the HBM and DDR specifications. AEC-Q100 is the automotive stress qualification standard for integrated circuits, with temperature grades from Grade 3 up to Grade 0. Neither is optional in its market.
- ISO 26262 functional safety
- The road-vehicle functional safety standard, with ASIL levels from A to D. It governs how a component is developed and documented, not merely how it performs, so it shapes design process, traceability and supplier selection from the start.
- MSL
- Moisture sensitivity level — how long a surface-mount package may sit exposed to ambient humidity before reflow without risking cracking. It drives dry-pack, bake and floor-life handling rules in every factory that touches the part.
- RoHS and REACH
- EU regimes restricting hazardous substances in electronics and requiring registration and disclosure of chemical substances. Compliance is documentary as much as material, and it flows down the whole supply chain.
- Export controls, the Entity List and ITAR
- US rules restricting export or re-export of advanced chips, design tools and manufacturing equipment to specified destinations and to companies named on the Entity List, with deemed-export rules that apply to sharing technology with foreign nationals inside the US. ITAR governs defence articles separately. These rules have tightened repeatedly and reach far past defence work.
- CHIPS Act funding and clawback
- Direct funding, loans and guarantees under the CHIPS and Science Act, awarded against milestones. Awards carry conditions — restrictions on advanced capacity expansion in countries of concern, limits on stock buybacks, upside-sharing provisions — and money can be clawed back if milestones or conditions are missed.
- Advanced Manufacturing Investment Credit
- The Section 48D federal investment tax credit for semiconductor manufacturing property, originally 25 percent of qualifying investment and raised to 35 percent by the 2025 tax law. For most projects it is worth considerably more than the direct grant.
- Allocation and long-term supply agreements
- When demand exceeds capacity a supplier allocates output by contract rather than by order date. LTAs lock volume and price years ahead, sometimes with prepayments or capacity reservation fees — the mechanism by which large buyers secured leading-edge and HBM supply.
- Design win and socket
- A design win is a customer committing your part into a product design; the socket is the specific position on the board it occupies. Revenue follows the customer's production ramp, often a year or more later, and displacing an incumbent socket means re-qualification the customer would rather avoid.
- BOM cost
- The bill-of-materials cost of every component in the finished product. Chips are sold into a BOM budget, so a part is judged on what it lets the designer remove elsewhere — an integrated SoC that eliminates three discrete devices wins at a higher unit price.